F20 Series Film Thickness Measurement Instruments

F20s are general-purpose film thickness measurement instruments, and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all of our thickness measurement instruments, the F20 connects to the USB port of your Windows® computer and sets up in minutes.

The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument's wavelength range. The standard F20 thickness measurement instrument is our most popular product.

Model Specifications

Model Thickness Range* Wavelength Range
F20 15nm - 70µm 380-1050nm
F20-EXR 15nm - 250µm 380-1700nm
F20-NIR 100nm - 250µm 950-1700nm
F20-UV 1nm - 40µm 190-1100nm
F20-UVX 1nm - 250µm 190-1700nm
F20-XT 0.2µm - 450µm 1440-1690nm
F3-sX Series 10µm- 3mm 960-1580nm
*film stack dependent

Thickness Measurement Range*

F20-UV F20-UVX F20 F20-EXR F20-NIR F20-XT F3-sX Series 1nm 10nm 100nm 1µm 10µm 100µm 1mm 10mm
F20-UV F20-UVX F20 F20-EXR F20-NIR F20-XT F3-sX Series 1nm 10nm 100nm 1µm 10µm 100µm 1mm 10mm

What’s Included

Additional Perks

Common Optional Accessories