F32-sX In-Line Thickness Measurement Series

The Compact Solution for In-line Thickness Measurements
Film thickness is measured in-line quickly and easily with the affordable F32-sX. Spectral analysis of reflectance from the top and bottom of your film provides thickness information in real time.

The F32-sX advanced-spectrometry system comes in a half-width 3U rack-mount chassis and, with additional spectrometers, can be configured to measure thinner films (with the VIS extension), or to measure up to two different locations. The F32-sX software can be controlled through digital I/O or the host software to start/stop/reset measurements. Measurement data can be exported automatically to the host software for statistical process control (SPC). Filmetrics® also provides optional lens assemblies for easy integration onto existing production fixtures.

The included software and USB connectivity make installing the F32-sX onto any Windows-platform PC simple. With help from the FILMeasure software, which is preloaded with over one-hundred materials, measurements of single and multilayer stacks are easily attainable. New materials can be added quickly by measuring the optical constants of samples or by importing data from an existing source.

Model Specifications

Model Thickness Range* Wavelength Range
F32-s980 10µm - 1mm 960-1000nm
F32-s1310 15µm - 2mm 1280-1340nm
F32-s1550 25µm - 3mm 1520-1580nm
*film stack dependent

Thickness Measurement Range*

F32 Series F32-s980 F32-s1310 F32-s1550 1nm 10nm 100nm 1µm 10µm 100µm 1mm 10mm
F32 Series F32-s980 F32-s1310 F32-s1550 1nm 10nm 100nm 1µm 10µm 100µm 1mm 10mm

What’s Included

Additional Perks

Common Optional Accessories