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Choose one of the dozens of predefined polar, rectangular, or linear map patterns, or create your own with no limit on the number of measurement points. The entire desktop system is set up in minutes and can be used by anyone with basic computer skills.
The F54 film thickness mapping system connects to the USB port of your Windows® computer and can be set up in minutes.
The different instruments are distinguished primarily by thickness and wavelength range. Generally shorter wavelengths (e.g. F54-UV) are required for measurement of thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films.
|Model||Thickness Range*||Wavelength Range|
|F54||20nm - 45µm||380-1050nm|
|F54-UV||4nm - 35µm||190-1100nm|
|F54-NIR||100nm - 115µm||950-1700nm|
|F54-EXR||20nm - 115µm||380-1700nm|
|F54-UVX||4nm - 115µm||190-1700nm|
|*Material and objective dependent|