There has been a great deal of R&D work done on porous silicon in recent years. Much of the interest is due to porous silicon's significant promise for use in a wide range of applications, including optical devices, gas sensors, and biomedical devices.
As with most new material technologies, part of the challenge of porous silicon development has been the finding tools with which to characterize various material parameters. For porous silicon, the most fundamental parameters of interest are layer thickness and porosity.
Other important parameters relate to processed layers, such as the fraction of impregnated materials or the amount of adsorbed molecules in sensing devices. Filmetrics has developed a unique analysis algorithm that reveals thickness, index, and porosity of porous silicon with a single mouse click. This algorithm is available at no charge on various F20, F40, and F50 instruments.
Contact our thin-film experts to discuss your porous silicon application.
Filmetrics offers free trial measurements - results are typically available in 1-2 days
