Measure film thickness in-line and in real-time at up to seven locations with the F37.

Example Layers

Almost any smooth and at-least-partially transparent films may be measured. This includes virtually any semiconducting material, including those used in thin-film photovoltaics.

Benefits

  • Dramatically improves productivity
  • Low cost-Can pay for itself in months
  • Accurate-Measure to better than ±1%
  • Fast-Measurements in seconds
  • Non-Invasive-Totally outside of deposition chamber
  • Easy to use-Intuitive Windows™ software
  • Turn-key system sets up in minutes
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Common Optional Accessories