Our F3 products are our newest and most advanced spectral reflectometers. They are most commonly used to measure thin-film properties by adding thickness and refractive index software modules. Thus equipped, they have all of the power of our popular F20 products, but they also benefit from on-board real-time wavelength calibration and a 40k-hour light source, meaning that long-term maintenance is essentially eliminated.

Thickness and refractive index can be measured in less than a second. Like all of our thickness measurement instruments, the F3 connects to the USB port of your Windows® computer and sets up in minutes. In fact, the standard F3 system requires no power aside from the USB connection.

The different F3 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument's wavelength range.

What's Included

Model Specifications

*Film stack dependent
Model Thickness Range* Wavelength Range
F3 15nm - 70µm 380-1050nm
F3-NIR 100nm - 250µm 950-1700nm
F3-UV 1nm - 40µm 190-1100nm
F3-XT 0.2µm - 450µm 1440-1690nm
F3-sX Series 10µm - 3mm 960-1580nm
Thickness Range*

Additional Perks

  • Library with over 130 materials included with every system, along with access to 100s more
  • Applications Engineers available for immediate 24-hour assistance (Mon-Fri)
  • Online "Hands On" support (internet connection required)
  • Hardware upgrade program