We offer a full line of film thickness measurement systems that connect to your Windows computer, as well as accessories for specific thickness measurement needs.
Thin Film Thickness Measurement Tool

General-Purpose Thin-Film Measurement Instruments

F20 The world's best-selling tabletop film thickness measurement system. Available with a wide range of accessories and thickness coverage.
Thin Film Thickness Measurement Device

Application-Specific Thin-Film Measurement Instruments

F10-AR Measures reflectance of ophthalmic lenses and other curved surfaces. Options available for transmittance and hardcoat thickness measurement.
F10-HC Measures hardcoat and anti-fog film thickness and index. Popular in automotive and other industries that hardcoat polycarbonate.
F10-PA Provides hands-free parylene thickness measurement.
F10-VC Measures reflectance and transmittance simultaneously. Options available for thickness and index measurement. Popular in vacuum coating applications.

On-Line Thickness Measurement Systems

F30 Monitors reflectance, thickness, and deposition rates during MOCVD, sputtering, and other deposition processes.
F37 In-line film thickness measurement instrument with up to seven probe locations supported.

Microscope-Based Film Thickness Instruments

F40 Attaches to your microscope to measure thickness and index in spots as small as 2.5µm.
F42 Complete 2-D thickness micro-mapping system.

Automated Thickness Mapping of Unpatterned Surfaces

F50 Adds automated mapping capabilities to our F20 family of products. Map Thickness and index as fast as two points per second.
F50-XY-450 Used for mapping samples larger than 300mm in diameter.
F60-t Production-ready tabletop thickness mapping system includes on-board reference, notch finding, interlocked cover, and more.

Automated Thickess Mapping of Patterned Semiconductors

F80-t Production-ready tabletop patterned-wafer thickness mapping system capable of 15-points in 21 seconds.
F80-c Cassette-to-cassette version of the F80-t. Supports up to 300mm wafers.
F80-a Automated thickness mapping with integrated wafer transfer tool. Supports up to 300mm wafers.

Filmetrics offers a variety of accessories to meet your film thickness measurement needs

Replacement Lamps – Replacement lamps are available for your light source.
Thickness standards – All Filmetrics film thickness standards can be

certified NIST-traceable.
Reference Materials – Replacement BK7 and silicon references.
General Accessories – Carrying cases, etc.
Stages and Stage Accessories – Standard and specialized stages.
Contact Probes – Measure curved and difficult surfaces.
Fibers – UV, VIS, and NIR replacement fibers.
Lens Assemblies – A variety of lens assemblies are available for your application.
Chucks for F50 and F60-t – Chucks are available for various size wafers.
Software Upgrades – Software is available for specialized applications.
Microscope Adaptors – Adaptors for the F40 series.
Optical Filters – Flatten spectral response.