Film Thickness Measurement

F20

The world's best-selling tabletop film thickness measurement system. Available with a wide range of accessories and thickness coverage.
aRTie

Measures reflectance and transmittance simultaneously. Options available for thickness and index measurement.
F10-ARc

Measures reflectance of lenses and other curved surfaces. Options available for hardcoat thickness measurement.
F10-RT

Measures reflectance and transmittance simultaneously. Options available for thickness and index measurement.
F10-HC

Measures hardcoat and anti-fog film thickness and index. Popular in automotive and other industries that hardcoat polycarbonate.
F3-CS

Provides thickness measurement of small witness or coupon samples.
F70

Measure the thickness of transparent materials up to 13mm and silicon wafer thickness up to 2mm.
F10-AR

Measures reflectance of ophthalmic lenses and other curved surfaces. Options available for transmittance and hardcoat thickness measurement.

Single-Spot Measurements

Tabletop systems for measuring film thickness and refractive index with a single mouse click. Measure thicknesses from 1nm to 13mm - even within multilayer film stacks.

Most products are in stock and available for immediate delivery.

F40

Attaches to your microscope to measure thickness and index in spots as small as 1µm.
F40-NSR

Integrates seamlessly onto your NanoSpec™ 180/210 System.
F42

Provides 2-D thickness maps with sub-micron grid spacing.

Microscopic-Spot Measurements

Used when a measurement spot as small as 1µm is required - use your own microscope or let us supply the entire system.

F50

Adds automated mapping capabilities to our F20 family of products. Map thickness and index as fast as two points per second.
F60-t

Production-ready tabletop thickness mapping system includes on-board reference, notch finding, interlocked cover, and more.
F60-c

Cassette-to-cassette version of the F60-t. Supports up to 300mm wafers.
F80-t

Production-ready tabletop patterned-wafer thickness mapping system capable of 15-points in 21 seconds.
F80-c

Cassette-to-cassette version of the F80-t. Supports up to 300mm wafers.

Automated Mapping Systems

Fully-automatic mapping of thickness and index for nearly any sample shape. Manual-load and robotic-load systems are available.

F30

Monitors reflectance, thickness, and deposition rates during MOCVD, sputtering, and virtually any other deposition process.
F37

Monitors reflectance, thickness, and deposition rates at up to seven locations simultaneously.

Inline Monitoring

Monitor and control thickness of moving films during production. Sample rates as high as 100 Hz are possible at multiple measurement locations.

Replacement Lamps

Replacement lamps are available for your light source.
Thickness Standards

All Filmetrics film thickness standards can be certified NIST-traceable.
Reference Materials

Replacement BK7 and silicon references.
General Accessories

Carrying cases, laptops, etc.
Stages & Stage Accessories

Standard and specialized stages.
Contact Probes

Used to measured curved and rough surfaces.
Fibers

UV, VIS, and NIR replacement fibers.
Lens Assemblies

A variety of lens assemblies are available for your application.
Chucks for F50 and F60-t

Chucks are available for various size wafers.
Software Upgrades

Software is available for specialized applications.
Microscope Adaptors

Adaptors for the F40 series.
Optical Filters

Used to flatten spectral response and improve measurement precision.