Thickness Measurement Products

  • F20 F20

    The world's best-selling tabletop film thickness measurement system. Available with a wide range of accessories and thickness coverage.

  • F3 F3

    Our latest products for measuring reflectance and film thickness integrate several advances in ease-of-use.

  • aRTie aRTie

    Measures reflectance and transmittance simultaneously. Options available for thickness and index measurement.

  • F10-ARc F10-ARc

    Measures reflectance of lenses and other curved surfaces. Options available for hardcoat thickness measurement.

  • F10-RT F10-RT

    Measures reflectance and transmittance simultaneously. Options available for thickness and index measurement.

  • F10-HC F10-HC

    Measures hardcoat and anti-fog film thickness and index. Popular in automotive and other industries that hardcoat polycarbonate.

  • F3-CS F3-CS

    Provides measurement of small witness or coupon samples.

  • F10-AR F10-AR

    Measures reflectance of ophthalmic lenses and other curved surfaces. Options available for transmittance and hardcoat thickness measurement.

  • F70 F70

    Measure the thickness of transparent materials up to 13mm and silicon wafer thickness up to 2mm.

Single-Spot Measurements

Tabletop systems for measuring film thickness and refractive index with a single mouse click. Measure thicknesses from 1nm to 13mm - even within multilayer film stacks.

Most products are in stock and available for immediate delivery.

  • F40 F40

    Attaches to your microscope to measure thickness and index in spots as small as 1µm.

  • F40-NSR F40-NSR

    Integrates seamlessly onto your NanoSpec™ 180/210 System.

  • F42 F42

    Provides 2-D thickness maps with sub-micron grid spacing.

Microscopic-Spot Measurements

Used when a measurement spot as small as 1µm is required - use your own microscope or let us supply the entire system.

  • F50 F50

    Adds automated mapping capabilities to our F20 family of products. Map thickness and index as fast as two points per second.

  • F60-t F60-t

    Production-ready tabletop thickness mapping system includes on-board reflectance standard, notch finding, interlocked cover, and more.

  • F60-c F60-c

    Cassette-to-cassette version of the F60-t. Supports up to 300mm wafers.

  • F80-t F80-t

    Production-ready tabletop patterned-wafer thickness mapping system capable of 15-points in 21 seconds.

  • F80-c F80-c

    Cassette-to-cassette version of the F80-t. Supports up to 300mm wafers.

Automated Mapping Systems

Fully-automatic mapping of thickness and index for nearly any sample shape. Manual-load and robotic-load systems are available.

  • F30 F30

    Monitors reflectance, thickness, and deposition rates during MOCVD, sputtering, and virtually any other deposition process.

  • F37 F37

    Monitors reflectance, thickness, and deposition rates at up to seven locations simultaneously.

Inline Monitoring

Monitor and control thickness of moving films during production. Sample rates as high as 100 Hz are possible at multiple measurement locations.

Accessories

Filmetrics offers a variety of accessories to meet your film thickness measurement needs.