What We Measure

Material: We can measure all at-least-partially-transparent films, plus all semiconductors (transparent or not). The measured film must be at least somewhat shiny in appearance.

Thickness range: The range of thicknesses that our products can measure is somewhat material dependent, but here is a rough guide:

Units	Thickness Range
	Minimum	Maximum
Å	10	10^8
nm	1	10^7
kÅ	0.01	10^5
µm	0.001	10000
µm-in	0.04	40^4
mils	0.00004	400
mm	10^-6	10
g/cm^2	10^-7	1

Refractive index can be measured for films greater than 10nm thick (again, this is material dependent).

Number of layers: We can usually measure up to three individual films in a stack. In some circumstances we can measure dozens of layers.

Substrate material: If the film is on a rough substrate (which includes most metals), generally the film's refractive index cannot be measured. In addition, rough substrates limit the minimum measurable film thickness to about 50nm.

Required information: We must know the ordering, identity, and nominal thickness of all films present, whether they are to be measured or not.

Contact our thin-film experts to discuss your film thickness measurement needs.

Filmetrics offers Free Trial Measurements - results are typically available in 1-2 days.