What We Measure
Material: We can measure all at-least-partially-transparent films, plus all semiconductors (transparent or not). The measured film must be at least somewhat shiny in appearance.
Thickness range: The range of thicknesses that our products can measure is somewhat material dependent, but here is a rough guide:
| Units |
Thickness Range |
| Minimum |
Maximum |
| Å |
10 |
10^8 |
| nm |
1 |
10^7 |
| kÅ |
0.01 |
10^5 |
| µm |
0.001 |
10000 |
| µm-in |
0.04 |
40^4 |
| mils |
0.00004 |
400 |
| mm |
10^-6 |
10 |
| g/cm^2 |
10^-7 |
1 |
Refractive index can be measured for films greater than 10nm thick (again, this is material dependent).
Number of layers: We can usually measure up to three individual films in a stack. In some circumstances we can measure dozens of layers.
Substrate material: If the film is on a rough substrate (which includes most metals), generally the film's refractive index cannot be measured. In addition, rough substrates limit the minimum measurable film thickness to about 50nm.
Required information: We must know the ordering, identity, and nominal thickness of all films present, whether they are to be measured or not.
Contact our thin-film experts to discuss your film thickness measurement needs.
Filmetrics offers Free Trial Measurements - results are typically available in 1-2 days.
