Comparison of Profilometry and Spectral Reflectance

Profilometry is an easy-to-understand mechanical technique for measuring film thickness. It works by monitoring the height of a stylus as it drags across a step in the film (see figure to right). The primary advantage of profilometry is that it can be used on all solid films, including opaque materials such as thick metal films. More expensive profilometry systems can also be used to map surface contours.

There are, however, disadvantages to profilometry. Most importantly, a sample with a step must be formed to measure film thickness, and film steps thus formed are often not perfect (see figure). This, combined with calibration error and mechanical drift, can often lead to significant errors (5-10%) in measured thickness.

In contrast, Spectral Reflectance (SR) is a non-contact technique that requires no sample preparation to measure film thickness. Light that is reflected from the film is analyzed in about one second to determine both a film’s thickness and refractive index. Multiple-layer films can also be measured with SR.

A summary of the main advantages of each technique is listed below.