Single-Spot
Measurements
Model Thickness
Range
Wavelength
Range
Standard
Spot Size

aRTie

Reflectance and/or transmittance measurement
Features: Compact, low-cost, non-UV systems have 40k-hour light source.
* Thickness measurement capability is optional.
aRTie 0.015-70 µm * 380-1050 nm 6000 μm
aRTie-UV 0.001-40 µm * 190-1100 nm 6000 μm

F3

Reflectance and film-thickness measurements
Features: Compact, low-cost, non-UV systems have 40k-hour light source.
* Thickness measurement capability is optional.
F3 0.015-70 µm * 380-1050 nm 100 μm
F3-NIR 0.1-250 µm * 950-1700 nm 100 μm
F3-UV 0.003-40 µm * 200-1100 nm 100 μm
F3-XT 0.2-450 µm * 1440-1690 nm 100 μm
F3-XXT 5-3000 µm * 1520-1580 nm 25 μm

F3-CP

Reflectance measurement of flat or curved samples
Features: Compact, low-cost, non-UV systems have 40k-hour light source.
* Thickness measurement capability is optional.
F3-CP 0.015-70 µm * 380-1050 nm 100 μm

F3-CS

Hands-free reflectance measurement of flat samples
Features: Compact, hands-free.
* Thickness measurement capability is optional.
F3-CS 0.015-70 µm * 380-1050 nm 100 μm

F10-AR

Reflectance measurement of large flat or curved samples
Features: Handheld probe for large samples and maximum versatility.
* Thickness measurement capability is optional.
F10-AR 0.2-15 µm * 380-1050 nm 100 μm
F10-AR-EXR 0.2-30 µm * 380-1700 nm 100 μm
F10-AR-NIR 0.5-30 µm * 950-1700 nm 100 μm
F10-AR-UV 0.1-15 µm * 200-1100 nm 100 μm
F10-AR-UVX 0.1-30 µm * 200-1700 nm 100 μm

F10-ARc

Reflectance measurement of AR coatings
Features: Includes color and reflectance alarms and hardcoat correction.
* Thickness measurement capability is optional.
F10-ARc 0.2-15 µm * 380-1050 nm 100 μm

F10-RT

Reflectance and/or transmittance measurement
Features: Accomodates larger samples than F2-RT, has built-in video.
* Thickness measurement capability is optional.
F10-RT 0.015-70 µm * 380-1050 nm 5000 μm
F10-RT-EXR 0.015-150 µm * 380-1700 nm 5000 μm
F10-RT-NIR 0.1-150 µm * 950-1700 nm 5000 μm
F10-RT-UV 0.003-40 µm * 200-1100 nm 5000 μm
F10-RT-UVX 0.003-150 µm * 200-1700 nm 5000 μm
F10-RTA 0.005-70 µm 380-1050 nm 5000 μm
F10-RTA-EXR 0.005-150 µm 380-1700 nm 5000 μm
F10-RTA-UV 0.003-40 µm 200-1100 nm 5000 μm
F10-RTA-UVX 0.003-150 µm 200-1700 nm 5000 μm

F20

The world's best-selling thin-film measurement system
Features: Our most versatile model. Includes full thickness and index measurement capabilities.
F20 0.015-70 µm 380-1050 nm 1500 μm
F20-EXR 0.015-250 µm 380-1700 nm 1500 μm
F20-NIR 0.1-250 µm 950-1700 nm 1500 μm
F20-UV 0.003-40 µm 200-1100 nm 1500 μm
F20-UVX 0.003-250 µm 200-1700 nm 1500 μm
F20-XT 0.2-450 µm 1440-1690 nm 1500 μm

F40

Microscope-based thin-film measurement system
Features: Attach to a microscope. Very small spot size.
F40 0.02-20 µm 400-850 nm 1 μm
F40-EXR 0.02-40 µm 400-1700 nm 1 μm
F40-NIR 0.04-40 µm 950-1700 nm 1 μm
F40-UV 0.004-40 µm 200-1100 nm 7 μm
F40-UVX 0.004-40 µm 200-1700 nm 7 μm

F70

Color-coded Thickness Measurement System
Features: Thickness range set by individual CTM lens (sold separately).
F70 0.15-15000 µm 380-1050 nm 10 μm
F70-NIR 100-2000 µm 950-1700 nm 10 μm
In-line
Measurements
Model Thickness
Range
Wavelength
Range
Standard
Spot Size

F30

Complete in-line thickness monitor
Features: Optional high-speed photodiode detectors.
F30 0.015-70 µm 380-1050 nm 1500 μm
F30-EXR 0.015-250 µm 380-1700 nm 1500 μm
F30-NIR 0.1-250 µm 950-1700 nm 1500 μm
F30-UV 0.003-40 µm 200-1100 nm 1500 μm
F30-UVX 0.003-250 µm 200-1700 nm 1500 μm
F30-XT 0.2-450 µm 1440-1690 nm 1500 μm
F30-XXT 5-3000 µm 1520-1580 nm 1500 μm

F37

Modular in-line thickness monitor for up to 7 locations
Features: Includes spectrometer(s), software, and 10k-hour light source.
F37 0.015-70 µm 380-1050 nm 1500 μm
F37-EXR 0.015-250 µm 380-1700 nm 1500 μm
F37-NIR 0.1-250 µm 950-1700 nm 1500 μm
F37-UV 0.003-40 µm 200-1100 nm 1500 μm
F37-UVX 0.003-250 µm 200-1700 nm 1500 μm
F37-XT 0.2-450 µm 1440-1690 nm 1500 μm
F37-XXT 5-3000 µm * 1520-1580 nm 1500 μm
Multi-Point Mapping Model Thickness
Range
Wavelength
Range
Standard
Spot Size

F42

2-D Microspot Thickness Mapper
Features: 2-D grid of up to a million points can be measured.
F42 0.035-3 µm 420-800 nm 5 μm

F50

Measures thickness etc. at two points/second
Features: Sample chucks (up to 300mm) sold separately.
F50 0.02-70 µm 380-1050 nm 1500 μm
F50-EXR 0.02-250 µm 380-1700 nm 1500 μm
F50-NIR 0.1-250 µm 950-1700 nm 1500 μm
F50-UV 0.005-40 µm 200-1100 nm 1500 μm
F50-UVX 0.005-250 µm 200-1700 nm 1500 μm
F50-XT 0.2-450 µm 1440-1690 nm 1500 μm
F50-XXT 5-3000 µm * 1520-1580 nm 1500 μm

F50-450

Measures thickness on 450mm wafers
Features: Sample chucks (up to 450mm) sold separately.
F50-450 0.02-70 µm 380-1050 nm 1500 μm
F50-450-EXR 0.02-250 µm 380-1700 nm 1500 μm
F50-450-NIR 0.1-250 µm 950-1700 nm 1500 μm
F50-450-UV 0.005-40 µm 200-1100 nm 1500 μm
F50-450-UVX 0.005-250 µm 200-1700 nm 1500 μm
F50-450-XT 0.2-450 µm 1440-1690 nm 1500 μm
F50-450-XXT 5-3000 µm * 1520-1580 nm 1500 μm

F50-XY

Measures thickness on large panels
Features: LCD panels are a common application.
F50-XY 0.02-100 µm 380-1050 nm 1500 μm
F50-XY-EXR 0.02-250 µm 380-1700 nm 1500 μm
F50-XY-NIR 0.1-250 µm 950-1700 nm 1500 μm
F50-XY-UV 0.005-40 µm 200-1100 nm 1500 μm
F50-XY-UVX 0.005-250 µm 200-1700 nm 1500 μm
F50-XY-XT 0.2-450 µm 1440-1690 nm 1500 μm
F50-XY-XXT 5-3000 µm * 1520-1580 nm 1500 μm

F60-c

Automated cassette-based film thickness mapping
Features: Supports 4" to 300mm wafers.
F60-c 0.02-70 µm 380-1050 nm 1500 μm
F60-c-EXR 0.02-250 µm 380-1700 nm 1500 μm
F60-c-NIR 0.1-250 µm 950-1700 nm 1500 μm
F60-c-UV 0.005-40 µm 200-1100 nm 1500 μm
F60-c-UVX 0.005-250 µm 200-1700 nm 1500 μm
F60-c-XT 0.2-450 µm 1440-1690 nm 1500 μm
F60-c-XXT 5-1000 µm 1520-1580 nm 1500 μm

F60-t

Production-oriented film thickness mapping
Features: Includes notch-finding, on-board baselining, and safety interlock.
F60-t 0.02-70 µm 380-1050 nm 1500 μm
F60-t-EXR 0.02-250 µm 380-1700 nm 1500 μm
F60-t-NIR 0.1-250 µm 950-1700 nm 1500 μm
F60-t-UV 0.005-40 µm 200-1100 nm 1500 μm
F60-t-UVX 0.005-250 µm 200-1700 nm 1500 μm
F60-t-XT 0.2-450 µm 1440-1690 nm 1500 μm
F60-t-XXT 5-3000 µm * 1520-1580 nm 1500 μm

F80-c

Automated cassette-based patterned wafer film thickness measurement
Features: Measure patterned wafers faster than one point per second.
F80-c 0.015-5 µm 400-800 nm 15 μm

F80-t

Tabletop patterned wafer film thickness measurement
Features: Measure patterned wafers faster than one point per second.
F80-t 0.015-5 µm 400-800 nm 15 μm