Measuring Ophthalmic Coating
Spectral reflectance is used on ophthalmic lenses to measure anti-reflection (AR) spectra and residual color, as well as hardcoat and hydrophobic film thickness measurement.Application Note Request
AR coatings are applied to reduce glare and the resulting eye fatigue caused by uncoated lenses. The blue-green hue of AR-coated lenses has also turned out to be an attractive feature for many consumers. Therefore measurement and control of the AR coating and its color has become increasingly important.
The Filmetrics F10-ARc was designed especially for ophthalmic applications and comes standard with a number of proprietary features for characterizing AR coatings.
Hardcoats are applied to impart increased scratch and UV resistance. This protection is supplied to the lens by covering it with the hardcoat and to the AR coating by providing a harder, less flexible foundation.
The Filmetrics F10-ARc is available with a hardcoat measurement upgrade. It is possible to measure both one- and two-layer hardcoats up to 15 microns thick.
Hydrophobic coatings impart water- and oil-repellent properties to AR-coated lenses, making them easier to clean. These layers are extremely thin - on the order of a hundred atoms - and thus require short-wavelength (UV) light to measure most accurately. The preferred instrument for measuring hydrophobic layer thickness is the F10-AR-UV with the UPG-RT-to-Thickness and UPG-Thickness-to-n&k upgrades.
Transmittance Measurements of Lenses
An optional stage (SS-Trans-Curved) for the F10-AR is available for measuring lens transmittance.
Thickness Measurement Example
Reflectance data was collected using our F10-ARc system with optional HC upgrade which allows hardcoat thickness measurement. This instrument uses an optical contact probe which inherently reduces the effect of backside reflections and allows for measurement on concave and convex surfaces.
The contact probe is placed on the surface of the lens. The spectral data is collected and then automatically analyzed by FILMeasure to determine if the lens meets the designated reflectance specifications. It is possible to measure average reflectance, local minima and maxima, and compensate for the presence of a hardcoat. This particular lens conformed to requirements and a clear “Good” indication is displayed to the system operator.
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Amorphous & Polysilicon
Measure thickness, crystallinity, and n and k of all forms of amorphous and polycrystalline silicon.
Our F80 Thickness Imaging products are used to measure oxide, STI, and metal CMP processes.
Filmetrics stocks instruments that measure the thousands of dielectric films used throughout industry.
CVD, dielectrics, barrier, PECVD, passivation, insulator, protection, Al2O3, CoO, ZnO, MoO, TiO2, Cr2O3, Nb2O5
Glass & Plastic Thickness
Measure thickness of glass and plastic materials up to 13mm thick.
Glass, Borosilicate glass, BSG, pyrex, BK7, Float glass, Crown glass, Soda-lime glass, SLG, Tube, tubing, Polyvinyl chloride, PVC, Plastic, Plastic film, Polymers, Tygon, Air gap, Lens, Acrylic, PMMA, acrylate, Lucite, Plexiglass, Perspex, Quartz, Fused Silica, Schott, Ohara, Pilkington, Polycarbonate, PC, Lexan, Makrolon, Polyethylene naphthalate, PEN, PET, Mylar, Melinex, Estar, PETE, Polyethylene, PE, LDPE, HDPE, Polypropylene, PP, Polystyrene, PS, Polylactic acid, PLA, Silicone, Optics, Ophthalmic, Vials
Filmetrics systems are used widely in the automotive industry to verify hardcoat and primer thickness.
Acrylic, Automotive industry, Chemical resistance, Clear coating, Decorative coating, Hardcoat, Eyewear, Face shield, Hardcoat, Hardness, Interpenetration Layer, Marring, Ophthalmic lens, Optical quality, Plastic lens, Polycarbonate, Polyester, Siloxane, Primer, Protective film, Scratch resistant, Screen protection, Surface finish, Surface protection, Thermal cure, Top coating, Touch screen, UV coating, UV cure
IC Failure Analysis
The F3-sX is used throughout the chip making industry to measure backside thinning of silicon.
Failure Analysis, FA, Silicon, Si, Integrated circuit, IC, Polishing, Backside failure analysis, Silicon thinning
ITO & Other TCOs
Proprietary analysis algorithms allow one-click measurement of TCO thickness, index, and k.
Indium tin oxide, ITO, tin-doped indium oxide, Transparent conductive oxide, TCO, Display, Front contact, Transparent Electrode, LED, LCD, Solar, Fluorine-doped tin oxide, FTO, TEC, TEC glass, Aluminum zinc oxide, AZO, Aluminum-doped zinc oxide, Zinc oxide, iZO, Indium zinc oxide, IZO, zinc-doped indium oxide
Measure thickness of angioplasty balloons, stent and implant coatings, and many others.
Stents, drug-coated stents, Drug-coating, Balloons, Angioplasty, Parylene, Microfluidic device, Air gap, Catheter, Membranes
Measure thickness, index, and k of metal films up to 50nm thick.
Metallized, Metallization, Foils, Stents, Mirrors, Steel, Stainless Steel, Gold, Nickel, Aluminium, Silver, Cobalt, Zinc, Molybdenum, Titanium, Chrome, Chromium, Niobium, Tungsten, Gallium, Germanium
Measure thickness and index of NPB, AlQ3, PEDOT, P3HT, soluble Teflons, etc…
PLED, AMOLED, Hole Transport (HT), Hole Injection Layer (HIL), Host Materials, anode, cathode, Alq3, NPB, phenylene vinylene, carbazole, thiophene, aniline, styrenesulfonate, phthalocyanine, naphthalene, fluorene, lithium, silver, ITO, calcium
Use the F10-AR to measure reflectance and color, as well as AR and hardcoat layer thicknesses.
eyeglasses, HC, hardcoat, scratch resistant, AR, anti-reflection, reflectance, UV curable, hydrophillic, polycarbonate, high index, CR39, MR-6, MR-7, Trivex
Simply set your parylene-coated sample on the stage of the F3-CS to measure its thickness!
We’ve measured dozens of different resists, and can generate index files for any resist you use.
SU-8, resist, Photoresist, PR, AZ, AZP, ZEP, positive, negative, g-line, i-line, KrF, PMMA, FEP, GRX, KMPR
Measure thickness, porosity, refractive index, and k of your porous silicon films.
Filmetrics offers a full range of products for measuring semiconductor process films.
Refractive Index & k
Measure refractive index and extinction coefficient over wavelengths as wide as 190-1700nm.
n & k, complex, real , imaginary, refractive index, absorption, extinction coefficient, indices, Kramers-Kronig, optical dispersion, dielectric, Lorentz, Cauchy, photoresist, anomalous dispersion, path length
Silicon Wafers & Membranes
We offer tabletop, mapping, and production systems for measuring silicon up to 2mm thick.
Measure CdTe, CdS, CIGS, amorphous-Si, TCOs, anti-reflection (AR) layers, and more...
Copper indium gallium diselenide, CIGS, Cadmium telluride, CdTe, Cad tel,, Amorphous silicon, Amorphous Si, a-Si, Cadmium sulfide, CdS, window layer, buffer layer, Thin-film photovoltaic, Thin-film PV, TFPV, photovoltaics, Solar, Solar cells, Inline, In-situ, Roll-to-roll, R2R, Evaporation, Sputtering, CVD, MOCVD, PECVD, Transparent conductive oxide, TCO, Indium tin oxide, ITO, tin-doped indium oxide
Semiconductor Teaching Labs
More than fifty Filmetrics F20s have been delivered for use in university teaching labs.
Surface Roughness & Finish
3-dimensional surface profile measurements to characterize surface roughness.
Filmetrics systems are widely used in the polymer-films community to measure thickness in-line.
Roll to roll, Roll measurements, Roll systems, Rolling substrate, Roll fed, Roll web, Reel to reel , R2R, Web coater, Autoweb, In-line, In-line monitor, Online thickness, Line monitoring system, Precision measuring tools, Automatic, Feeding, Production, Multipoint, High speed