An Advanced Thin-Film Measurement System at an Affordable Price

The F20-HC is based on the Filmetrics F20 platform where analysis of spectral reflectance data provides film measurement results quickly. Plus, the advanced simulation algorithms in the F20-HC software are specifically designed to measure single and multiple layers (e.g., primer/hardcoat) encountered in thick film and opthalmic lens applications.

For applications where the surface is curved, the CP-1 Contact Probe is included.

Download the F20-HC datasheet (163 kB)

SPECIFICATIONS:
Thickness range: 0.1 to 50 microns
Spot Size: 200 µm to 1 cm
Sample Size: From 1 mm to 300 mm diameter and up
Accuracy*: The greater of 0.4% or 10 Å
Precision*: 0.001 µm
Stability*: 0.001 µm
Spectrometer Type: 512-element silicon array
Light Source: Regulated Tungsten-Halogen
Power Requirements: 100-240 VAC, 50-60 Hz, 0.3-0.1 A

* Typical values in spectrum matching mode. Layer stack dependent.