Thickness and optical constants (n and k) are measured quickly and easily with the F20 advanced spectrometry system. Spectral analysis of reflectance from the top and bottom of the thin film provides thickness, refractive index, and extinction coefficient in less than a second. The entire desktop system sets up in minutes and can be used by anyone with basic computer skills.

The F20 includes everything required for measurements: spectrometer, light source, fiber optic cable, sample stage, and Windows™ application software — just add your computer.

Download the F20 datasheet (152 kB)

Example Layers
Virtually any smooth, translucent, or lightly absorbing film may be measured, including:
SiO2
SiNX
DLC
Photoresist
Polymer layers
Polyimide
Polysilicon
Amorphous Silicon
Silicon
Parylene
Industrial Coatings

Example Substrates
For thickness measurements, all that is required in most cases is a smooth, reflective substrate. For optical constant measurements, a flat specularly reflecting substrate is required. If the substrate is transparent, the backside of the substrate must be prepared so that it is not reflective. Examples include:
Silicon
Glass
Aluminum
GaAs
Steel
Polycarbonate
Polymer films