Metal Thickness Measurements

XRF (X-ray fluorescence) is the most common method for measuring metal films that are greater than 50 nm thick. To measure metal films thinner than 50 nm spectral reflectance (SR) and transmittance are commonly used. Our Filmetrics F10-RT can be configured to measure the thickness of metal films from 1 to 50 nm thick. Our PARTS system can also measure this thickness range, along with the metal’s refractive index and extinction coefficients. Both systems are faster and less expensive than XRF analyzers. Like all Filmetrics systems, all they require is a few seconds and a mouse click!

To discuss your metal thin-film application, contact our thin-film experts.

Filmetrics offers free trial measurements - results are typically available in 1-2 days.